Agilent’s Latest 7500 AFM Now Available

Agilent Technologies has introduced its latest offering in the Atomic Force microscopy segment, the Agilent 7500 Atomic Force Microscope (AFM). The new 7500 AFM is designed for industrial, research as well as academic laboratory use. It has a 90µm closed loop scanner to achieve atomic resolution imaging, which in combination with other features makes it an ideal equipment for laboratories.

Agilent’s new 7500 AFM features the company’s patented top-down tip scanner technology, making it capable of imaging samples in air, fluids and under controlled temperature and environmental conditions. The presence of an integrated environmental chamber in the equipment provides a sealed sample compartment isolated from rest of the system, which along with an array of ports and sensors offers control over the environment and temperature inside the system. The AFM’s scanner comes with a standard nose cone for use in contact, AAC, CS-AFM, EFM, KFM, MFM and MAC modes. The standard cone can be easily replaced for other additional AFM techniques. Agilent 7500 AFM is also capable of advanced imaging and electrochemistry applications.

The functions of Agilent 7500 AFM are controlled by the company’s easy to use, intuitive and flexible PicoView software. In addition to PicoView, the company’s Pico Image software extends the device’s post processing capabilities and helps build surface analysis reports using multi-layer measurement data. Agilent 7500 AFM finds its use in material science, life science, polymer science, electrochemistry, nanolithography and other applications.

Source: Agilent