Revolutionise 3D Imaging with the Cutting-Edge ZEISS VersaXRM 730

The new ZEISS VersaXRM 730 Revolutionises the Category of 3D X-ray Microscopy; Strengthens Resolution, Speed, and Accessibility for Scientists and Researchers.

ZEISS has announced the launch of its new X-ray microscopy solution, the ZEISS VersaXRM 730 ® – a microscopy solution designed to meet the intensive needs of modern research. The company is claiming to achieve unprecedented resolution and intuitive operation at faster throughput than any other device available. Flexible applications make VersaXRM 730 strive for ubiquitous improvement of productivity as well as access to high performance 3D imaging.

Among the key benefits of the ZEISS VersaXRM 730 is that it provides researchers with a significantly enhanced quality and speed in 3D X-ray microscopy. One of the key features is FAST Mode, which performs one-minute tomographies. This feature allows researchers to easily produce detailed 3D images faster than ever before. The seamless integration with award-winning ZEN navx™ software ensures intuitive guiding and automated workflows so that even inexperienced users can work with the system easily to get high-quality data.

Accessibility for Researchers of Any Skill Level

By bringing the ZEN navxTM control system onboard, the process of 3D characterization has become less burdensome for users. Human-centered design allowe even inexperienced users to easily operate the microscope. The SmartShield feature comes up with safeguarding of the system as well as samples. It can be used in busy environments like universities’ laboratories where many users will have access to the same piece of equipment.

The VersaXRM 730 boasts of an essential flat panel extension (FPX). It is combined with FAST Mode to produce real-time 3D imaging for most sample types. Researchers can almost instantly navigate samples in a way to boost efficiency without sacrificing the accuracy that ZEISS is known to deliver. The system also supports varied sample sizes and makes sure to maximise the resolution with the 40x-Prime detector.

AI-Powered Insights for a New Research Paradigm

Advanced AI technologies in the ZEISS VersaXRM 730 bring game-changing solutions in terms of DeepRecon Pro for improved image reconstruction and throughput. Significant additional AI capabilities are now made available to the system, aiming toward cutting-edge applications in advanced research materials science, life sciences, and further fields. Hardware and software innovation are seamlessly integrated from data acquisition all the way to analysis for a highly efficient user experience.

The ZEISS VersaXRM 730 concept combines ease-of-use, quick data collection combined with high-resolution imaging to create a new benchmark across the industry. A decent update to the already impressive line of research and diagnosis focused microscopy devices

Know more about ZEISS VersaXRM 730 here.