JEOL Introduces New Extended Pressure, High Resolution SEM

JEOL, the well known manufacturer of electron microscopes and instrumentation as recently introduced a new Scanning Electron Microscope (SEM). The new JSM-IT300LV tungsten low vacuum SEM shares the goodness of the company’s award winning InTouchScope analytical SEM platform, on which it is built and JSM-6610LV analytical SEM.

The new JEOL JSM-IT300LV has a resolution of 3.0nm at 30kV with a magnification range between 5X to 300000X and offers great resolution, versatility and user interface. It has an extended vacuum pressure range of 10-650pA, that is twice as much as that of previous models. The equipment’s large specimen chamber makes it easier to analyze large specimens with diameters up to 300 mm and height up to 80 mm. The JSM-IT300LV can be easily customized depending upon the requirements. It comes with ports for attaching other analytical equipments like cathodluminiscence detectors, chamberscopes, electron backscatter diffraction, energy dispersive X-ray spectrometer, heating and cooling substages, wavelength dispersive X-ray spectrometer etc. Custom sample holders are available to mount samples of different sizes and shapes easily inside the specimen chamber.

Users can choose to operate JEOL JSM-IT300LV either by using the multitouch touchscreen, mouse and keyboard or knobs. The specimen control includes an embedded CCD camera and a 5 axis stage control with fast asynchronous movement for proper alignment of the sample in required angle and orientation to obtain clear high resolution images of the specimen.

Source: JEOL