Bruker Presents New Scientific Instruments at Analytica 2016

Bruker Corporation introduced new scientific instruments and analytical solutions at the Analytica Trade Fair for Laboratory Technology held this month in Munich. The new tools improve sensitivity and productivity in the pharmaceutical, applied and industrial markets.

Applied and Pharmaceutical Markets

The SENTERRA II is a Raman microscope with various acquisition modes to optimize spatial resolution and a redesigned engine for better performance. Parameter setting is fully automated thanks to motorized lasers, graftings, filters and apertures. The SENTERRA II is compliant with GLP, GMP and 21CFRp11 regulations and features automated test routines for operational and performance qualification (OQ/PQ).

The S4 TSTAR total reflection X-ray fluorescence (TXRF) spectrometer performs ultra-trace elemental analysis for pharma, food and environmental testing. It features three excitation modes and an XFlash silicon drift detector (SDD) to identify extremely small quantities of any element. It includes an automatic sample changer for 90 samples and an internal QA sample to stabilize system parameters for 24/7 operation.

The MALDI PharmaPulse rapifleX is based on a 10KHz laser rapiflex MALDI-TOF system and integrates automation, thus becoming the first MS-based, label-free ultra-high throughput screening (uHTS) tool. It can analyze 1536 microtitre plates in less than eight minutes and do primary screens of millions of compounds with a low cost per sample.

Food and Environmental

The minspec G-Var is a new method to determine droplet size distribution in food emulsions. Designed for Bruker’s Time Domain NMR minispec, it has been developed with Unilever. The G-Var is faster and cheaper than the old D-Var and has a lower quantification limit in droplet phase and size.

The PesticideScreener and the ToxScreener 2.1 are based on Bruker’s QTOF instruments, and can screen, identify, confirm and quantify hundred of compounds in an experiment. Both tools feature a larger screening database and new software.

Nanoanalysis, microscopy and advanced materials research

The ESPRIT QUBE software allows 3D visualization and post-processing of data acquired with electron backscatter diffraction systems (EBSD) or energy-dispersive X-ray spectrometers (EDS) on electron microscopes. It features many options for data filtering, sub-setting, simulation and visualization.

The SPECTRA ELEMENTS software suite allows to exploit the analytical performance of the S2 PUMA benchtop EDXRF spectrometer. Thanks to the new package, the S2 PUMA can be used in material science R&D applications, geology, mining and building materials industries to quantify element concentrations.

The Contour CMM Dimensional Analysis System is the world’s first non-contact metrology system to perform simultaneous nanoscale height, surface texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing.

The FastScan Pro Industrial AFM integrates low noise and fast scanning technology to achieve high throughput without reducing data quality. Software automation reduces complex routines to push-button operations.

Source: Bruker