The newest generation of NanoWizard AFM system is now available for inverted microscopes. This system is manufactured by JPK Instruments, a German company known for its nanoanalytical instrumentation for life science and soft matter research.
This next generation NanoWizard ULTRA Speed AFM pushes the performance boundaries of analytical instruments by providing faster scanning, at line rates greater than 100 Hz along with superior atomic resolution capabilities to inverted microscopes in closed loop modes. The system has an enhanced scanner with superior tip-scanning design, position sensor and detection systems for improved capabilities, all thanks to the company’s latest lowest noise cantilever deflection system and high bandwidth electronics. It can be used for quantitative material property mapping by switching to Quantitative Imaging (QI) mode while the DirectOverlay mode can be used for precision corelative microscopy. Using NanoWizard ULTRA Speed AFMs, changes in samples can be tracked in real-time , irrespective of whether its imaged in air or liquid.
The new JPK NanoWizard ULTRA Speed AFM system is compatible with a wide range of imaging modes and accessories. JPK’s RampDesigner and ExperimentPlanner imparts the system with extensive force measurement capabilities that makes measurements on cell surface and single molecules possible. The new NanoWizard ULTRA Speed system on an inverted microscope is ideal for cutting edge biological and nano science applications.